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Infrared Optical Properties of Materials

 

Accurate measurements of the optical properties of materials in the infrared spectral range play an increasingly important role in the aerospace and defense industries, optical engineering, condensed matter physics, remote sensing, radiative heat transfer measurements and related areas. The laboratory for infrared optical properties measurements has established high accuracy infrared reflectance and transmittance capabilities for wavelengths between 1 µm and 18 µm. Near normal absolute spectral reflectance and transmittance of both specular and diffuse samples can be measured from near ambient to 200 °C using a custom integrating sphere and Fourier transform (FT) spectrometer. Additional capabilities for specular samples include transmittance down to 10 K using an optical cryostat, as well as variable angle transmittance and reflectance using a custom goniometer and polarizers. Special test measurements are performed for both NIST and external customers in government and industry on a wide variety of materials including mirrors, filters, windows, coatings and cavity structures. Emittance and absorptance are obtained indirectly through combining the reflectance and transmittance under identical conditions. Also, a newly developed facility is available for the measurement of directional spectral emittance for sample temperature up to 1000 °C, accomplished through comparison of radiance with reference blackbody sources. This new facility supplements and extends the overall optical properties effort to be more comprehensive in meeting the customers' needs and providing the highest accuracy data.

Infrared Spectrophotometry

Infrared Laser Gonioreflectometer Instrument (ILGRI)

Complete Hemispherical Infrared Laser-based Reflectometer (CHILR)

Our Approach to Optical Property Measurements

Develop comprehensive measurement capability for the infrared spectral region

  • Wide range of optical properties
  • Wide range of material types (specular & diffuse, transmissive & opaque)
  • Cover range of critical parameters (temperature, beam geometry & polarization state)

Evaluate and develop measurement methodologies for high accuracy

  • Direct method for absolute hemispherical reflectance
  • Use integrating sphere for specular samples
  • Develop Monte Carlo techniques for analysis and optimization of instrument

Investigate and understand major sources of measurement error

  • Fourier Transform Spectrometry (hardware and software)
  • Detector spatial uniformity and linearity
  • Compare direct and indirect emittance and reflectance
Develop, design and implement custom accessory instrumentation Intercompare with other techniques and other Laboratories
  • Compare FT with laser and monochromotor measurements
  • Internal with UV-vis-NIR reference instruments
  • External with National Metrological Institutes

Capabilities

  • Spectral Regular Transmittance, λ = 1 µm to 100 µm
  • Spectral Specular Reflectance (opaque and transparent samples),
    • normal incidence λ = 1 µm to 18 µm
    • variable angle (10° to 80°) λ = 1 µm to 5 µm (to 25 µm)
  • Spectral Directional-Hemispherical Reflectance and Transmittance (diffuse samples), λ = 290 K to 475 K
  • Spectral Absorptance and Emittance, Indirect Measurements (1 - R - T), from above capabilities (specular and diffuse samples)
  • Spectral Emittance, Direct measurements, λ = 1 µm to 20 µm, 575 K to 1275 K
  • Spectral Refractive Index, λ = 0.5 µm to 20 µm
  • Laser-based Bi-directional Reflectance and Transmittance Distribution Function (BRDF and BTDF) and Total Integrated Scatter (TIS)
  • Polarimetry
  • Ellipsometry

Measured optical properties

For technical information or questions, call:
Phone: 301-975-2344
Phone: 301-975-2336
Fax: 301-869-5700
Fax: 301-869-5700
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Online: November 2006 - Last Update: February 2008